Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/3898
Title: Novel Design of RF MEMS Switch with Reduction in Stress Gradient to Increase Reliability
Authors: Chauhan, Abhishek
Singh, Harpreet
Keywords: Manufacturing Engineering
Issue Date: May-2015
Publisher: Lovely Professional University
URI: http://localhost:8080/xmlui/handle/123456789/3898
Appears in Collections:Mechanical Engineering

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11008897_5_7_2015 4_02_26 PM_Complete Dissertation Report.pdf1.75 MBAdobe PDFView/Open


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