Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/6378
Title: Detection of varieties and defects of soybean seeds using deep learning techniques
Authors: Vikasrao, Sabale Amar
Singh, Parminder
Keywords: Computer science and engineering
Issue Date: 2024
Publisher: Lovely Professional University,Phagwara
URI: http://localhost:8080/xmlui/handle/123456789/6378
Appears in Collections:Ph.D Thesis

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