1. Lovely Professional University
  2. Ph.D Thesis
  3. Ph.D Thesis
Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/6418
Title: Testing and fault analysis of embedded sram in low power technologies using parasitic r and c extraction method
Authors: Maddela, Venkatesham
Sinha, Sanjeet K
Parvathi, Muddapu
Keywords: Electronics and communication engineering
Issue Date: 2024
Publisher: Lovely Professional University,Phagwara
URI: http://localhost:8080/xmlui/handle/123456789/6418
Appears in Collections:Ph.D Thesis

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