1. Lovely Professional University
  2. Ph.D Thesis
  3. Ph.D Thesis
Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/6418
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dc.contributor.authorMaddela, Venkatesham-
dc.contributor.authorSinha, Sanjeet K-
dc.contributor.authorParvathi, Muddapu-
dc.date.accessioned2024-12-03T07:15:25Z-
dc.date.available2024-12-03T07:15:25Z-
dc.date.issued2024-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/6418-
dc.language.isoen_USen_US
dc.publisherLovely Professional University,Phagwaraen_US
dc.subjectElectronics and communication engineeringen_US
dc.titleTesting and fault analysis of embedded sram in low power technologies using parasitic r and c extraction methoden_US
dc.typeThesisen_US
Appears in Collections:Ph.D Thesis

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